Heinrich Theodor Vierhaus

Heinrich Theodor Vierhaus received a diploma degree in electrical engineering from Ruhr-University Bochum (Germany) in 1975. From 1975 to 1977 he was with the German Volunteer Service (DED/ GVS), teaching electronic and RF engineering courses at the Dar-es-Salaam Technical College in Tanzania (East Africa). Later he became a research assistant at the University of Siegen Germany), where he received a doctorate (Dr.- Ing.) in microelectronics in 1983. From 1983 to 1996 he was a senior researcher with GMD, the German national research institute for information technology at St. Augustin near Bonn, where he became the acting director of the System Design Technology Institute (SET) in 1993. During this time he also served as a part-time lecturer for the University of Bonn and Darmstadt University of Technology. Since 1996 he has been a full professor for computer engineering at Brandenburg University of Technology Cottbus. He has authored or co-authored more than 100 papers in the area of IC design and test technology. He has been a member of the IEEE for about 30 years.

Publications

Design and Test Technology for Dependable Systems-on-Chip
Design and Test Technology for Dependable Systems-on-Chip
Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus. © 2011. 578 pages.
Designing reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have...
Self-Repair Technology for Global Interconnects on SoCs
Self-Repair Technology for Global Interconnects on SoCs
Daniel Scheit, Heinrich Theodor Vierhaus. © 2011. 21 pages.
The reliability of interconnects on ICs has become a major problem in recent years, due to the rise of complexity, low-k-insulating material with reduced stability, and...
Built-in Self Repair for Logic Structures
Built-in Self Repair for Logic Structures
Tobias Koal, Heinrich Theodor Vierhaus. © 2011. 25 pages.
For several years, many authors have predicted that nano-scale integrated devices and circuits will have a rising sensitivity to both transient and permanent faults effects....
SoC Self Test Based on a Test-Processor
SoC Self Test Based on a Test-Processor
Tobial Koal, Rene Kothe, Heinrich Theodor Vierhaus. © 2011. 17 pages.
Testing complex systems on a chip (SoCs) with up to billions of transistors has been a challenge to IC test technology for more than a decade. Most of the research work in IC...