Today’s modern goods are incredibly trustworthy and reliable due to recent scientific advances, innovation, and developments based on computers, automation, and simulations. Because systems, gadgets, and equipment are frequently used for long periods of time in typical working conditions, ordinary life tests are time-consuming and costly. As a result, performing normal reliability testing to acquire failure data from these types of exceptionally durable equipment has become a prohibitively expensive and time-consuming operation. In these kinds of cases, accelerated life tests (ALTs) can be employed to reduce the length of the test and hence the testing costs. Accelerated Life Testing may be impressive in a number of ways, including delivering high-quality goods that will survive much beyond the guaranteed duration. Cost-cutting in the production process determines the precise number of technical staff members to recruit, a clearer understanding of market pricing of products, helps to keep improving the reputation of the company and its products, and enhances the ability to provide extended warranty packages confidently.
This book explores all of the Accelerated Life Testing (ALT) and Partially Accelerated Life Testing (PALT) models in depth, highlighting the similarities and differences as well as the benefits and drawbacks of each approach. Furthermore, the book not only covers traditional strategies for data analysis for reliability, but it also includes new computer-based graphical, analytical, and simulation-based methodologies to complement and update the existing procedures.