MLA
Baláž, Marcel, et al. "Delay Faults Testing." Design and Test Technology for Dependable Systems-on-Chip, edited by Raimund Ubar, et al., IGI Global, 2011, pp. 377-394. https://doi.org/10.4018/978-1-60960-212-3.ch017
APA
Baláž, M., Dobai, R., & Gramatová, E. (2011). Delay Faults Testing. In R. Ubar, J. Raik, & H. Vierhaus (Eds.), Design and Test Technology for Dependable Systems-on-Chip (pp. 377-394). IGI Global. https://doi.org/10.4018/978-1-60960-212-3.ch017
Chicago
Baláž, Marcel, Roland Dobai, and Elena Gramatová. "Delay Faults Testing." In Design and Test Technology for Dependable Systems-on-Chip, edited by Raimund Ubar, Jaan Raik, and Heinrich Theodor Vierhaus, 377-394. Hershey, PA: IGI Global, 2011. https://doi.org/10.4018/978-1-60960-212-3.ch017
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