MLA
Tripathi, Suman Lata. "Design for Testability of High-Speed Advance Multipliers: Design for Testability." AI Techniques for Reliability Prediction for Electronic Components, edited by Cherry Bhargava, IGI Global, 2020, pp. 175-190. https://doi.org/10.4018/978-1-7998-1464-1.ch010
APA
Tripathi, S. L. (2020). Design for Testability of High-Speed Advance Multipliers: Design for Testability. In C. Bhargava (Ed.), AI Techniques for Reliability Prediction for Electronic Components (pp. 175-190). IGI Global. https://doi.org/10.4018/978-1-7998-1464-1.ch010
Chicago
Tripathi, Suman Lata. "Design for Testability of High-Speed Advance Multipliers: Design for Testability." In AI Techniques for Reliability Prediction for Electronic Components, edited by Cherry Bhargava, 175-190. Hershey, PA: IGI Global, 2020. https://doi.org/10.4018/978-1-7998-1464-1.ch010
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