MLA
Tsai, Wei-Tek, et al. "Rapid Pattern-Oriented Scenario-Based Testing for Embedded Systems." Software Evolution with UML and XML, edited by Hongji Yang, IGI Global, 2005, pp. 222-262. https://doi.org/10.4018/978-1-59140-462-0.ch008
APA
Tsai, W., Paul, R., Yu, L., & Wei, X. (2005). Rapid Pattern-Oriented Scenario-Based Testing for Embedded Systems. In H. Yang (Ed.), Software Evolution with UML and XML (pp. 222-262). IGI Global Scientific Publishing. https://doi.org/10.4018/978-1-59140-462-0.ch008
Chicago
Tsai, Wei-Tek, et al. "Rapid Pattern-Oriented Scenario-Based Testing for Embedded Systems." In Software Evolution with UML and XML, edited by Hongji Yang, 222-262. Hershey, PA: IGI Global, 2005. https://doi.org/10.4018/978-1-59140-462-0.ch008
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