MLA
Scheit, Daniel and Heinrich Theodor Vierhaus. "Self-Repair Technology for Global Interconnects on SoCs." Design and Test Technology for Dependable Systems-on-Chip, edited by Raimund Ubar, et al., IGI Global, 2011, pp. 195-215. http://doi:10.4018/978-1-60960-212-3.ch009
APA
Scheit, D., & Vierhaus, H. T. (2011). Self-Repair Technology for Global Interconnects on SoCs. In Ubar, R., Raik, J., & Vierhaus, H. T. (Ed.), Design and Test Technology for Dependable Systems-on-Chip (pp. 195-215). IGI Global. http://doi:10.4018/978-1-60960-212-3.ch009
Chicago
Scheit, Daniel, and Heinrich Theodor Vierhaus. "Self-Repair Technology for Global Interconnects on SoCs." In Design and Test Technology for Dependable Systems-on-Chip. edited by Raimund Ubar , Jaan Raik , and Heinrich Theodor Vierhaus, 195-215. Hershey, PA: IGI Global, 2011. http://doi:10.4018/978-1-60960-212-3.ch009
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