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Dear Colleague,

I would like to inform you about a recent publication by IGI Global:

Title: OOPS! (OntOlogy Pitfall Scanner!): An On-line Tool for Ontology Evaluation
Author(s)/Editor(s): María Poveda-Villalón (Ontology Engineering Group, Universidad Politécnica de Madrid, Madrid, Spain); Asunción Gómez-Pérez (Ontology Engineering Group, Universidad Politécnica de Madrid, Madrid, Spain); Mari Carmen Suárez-Figueroa (Ontology Engineering Group, Universidad Politécnica de Madrid, Madrid, Spain)
ISSN: 1552-6283
EISSN: 1552-6291
URL: https://www.igi-global.com/article/oops-ontology-pitfall-scanner/116450

I would appreciate if you would forward this information to your librarian along with your recommendation for library acquisition.

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Librarians: All IGI Global publications are available in print and perpetual access versions. Contact IGI Global or your bookseller for more information.

Questions or orders may be forwarded to:
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E-mail: cust@igi-global.com
www.igi-global.com

 

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