- Editor-in-Chief Emeritus
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Aimé Lay-Ekuakille, University of Salento, Italy
- International Advisory Board
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Arun Fera M, Thiagarajar College of Engineering, India
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C L V R S V Prasad, GMR Institute of Technology, Kakinada, India
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K VINOTH KUMAR, New Horizon College of Engineering, India
https://orcid.org/0000-0002-3009-1658 -
P. Govinda Rao, GMR Institute of Technology, India
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Rupesh Kumar, Systems RF, XLIM Research Institute, France
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Soubantika Palchoudhury, University of Dayton, United States
https://orcid.org/0000-0002-0696-0454
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Srinivasan Ganesh Kumar, Anna University, India
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Surjit Singh, Thapar Institute of Engineering & Technology, Patiala, Punjab, India, India
https://orcid.org/0000-0002-2386-7729
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Yunus Arslan, Istanbul Univesity, Turkey
- Associate Editors
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Andreas Lymberis, European Comission, Belgium
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Claudio De Capua, Mediterranean University of Reggio Calabria, Italy
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Domenico Grimaldi, University of Calabria, Italy
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Domenico Laforgia, University of Salento, Italy
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Dominic Onyango, Multimedia College University of Nairobi, Kenya
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Giuseppe Ricci, University of Salento, Italy
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Leo Van Biesen, Free University of Brussels, Belgium
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Linus Michaeli, Kosice Technical University, Slovakia
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Massimo Villari, University of Messina, Italy
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Mel Siegel, Carnegie Mellon University, United States
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Olfa Kanoun, Chemnitz Technical University, Germany
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Paolo Bonato, Harvard Medical School, United States
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Pasquale Daponte, University of Sannio, Italy
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Pedro Girao, Instituto Superior de Telecomunicaoes, Portugal
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Ramiro Velázquez, Universidad Panamericana, Mexico
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Roman Malaric, University of Zagreb, Croatia
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Sanowar Khan, City University of London, United Kingdom
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Silvestro Micera, Sant’Anna School of Pisa, Italy
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Subhas Mukhopadhyay, Massey University, New Zealand
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Sunao Yamashita, DKK-TOA Corporation, Japan
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Vito Telesca, University of Basilicata, Italy
- Editorial Review Board
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Adel Alimi, Université de Sfax, Tunisia
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Alfonso Centuori, CMC Srl, Italy
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Amerigo Trotta, Polytechnic of Bari, Italy
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Andrea Baschirotto, University of Milan-Bicocca, Italy
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Antonio Ficarella, University of Salento, Italy
https://orcid.org/0000-0003-3206-4212
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Beata Palczynska, Gdynia Maritime University, Poland
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Bernd Neuner, Tigo Energy, Germany
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Claudine Gehin, Institut National des Sciences Appliquées, France
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Cristian Fosalau, Technical University of Iasi, Romania
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Domenico Chianese, University of Applied Sciences and Arts, Switzerland
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Emiliano Schena, Università Campus Bio-Medico di Roma, Italy
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F.M. Tshizanga, Université Pédagogique Nationale, Congo, The Democratic Republic Of The
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Faouzi Derbel, QVEDIS GmbH, Germany
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Francesco Amato, University of Catanzaro, Italy
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Gerhard Fischerauer, University of Bayreuth, Austria
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Gerson Rocha, Brazilian Metrology Society, Brazil
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Gourab Sen Gupta, Massey University, New Zealand
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Jean-Marie Moanda, Ndeko, Congo, The Democratic Republic Of The
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Klaus-Dieter Sommer, Physikalisch-Technische Bundesanstalt, Germany
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Luigi Notaro, Lecroy, Italy
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Marco Liserre, Polytechnic of Bari, Italy
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Mart Mirt, Tallin University of Technology, Estonia
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Massimo De Vittorio, University of Salento, Italy
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Mladen Borsic, Croatian Metrological Society, Croatia
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Nabil Derbel, National School of Engineers of Sfax, Tunisia
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Nitin Mandavgade, Priyadarshini College of Engineering, India
https://orcid.org/0000-0003-1052-7239
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Octavian Postolache, Institutode Telecomunicaoes, Portugal
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Pawel Turcza, AGH University of Kracow, Poland
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Peter Palensky, University of Vienna, Austria
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Philippe Vanderbemden, University of Liège, Belgium
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Pietro Siciliano, Institute for Microelectronics and Microsystems, Italy
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Roland Collay, Measuring Club of Rhône Alps, France
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Rosario Morello, University of Reggio Calabria, Italy
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Sergey Yurish, Catalunya University of Barcelona, Spain
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Sergio Casciaro, Istituto di Fisiologia Clinica, Italy
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Sergio Rapuano, University of Sannio, Italy
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Sheila Bailey, NASA Glenn Research Center, United States
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Susana Borromeo, Universidad Rey Juan Carlos, Spain
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Theodore Laopoulos, Aristotle University of Thessaloniki, Greece
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Tina Liguori, University of Salerno, Italy
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Tom Zielinsky, AGH University of Kracow, Poland
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Umberto Pogliano, Istituto Nazionale di Ricerca Metrologica, Italy
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Voicu Croza, University of Ottawa, Canada
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Wolfgang Schufft, Chemnitz Technical University, Germany
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Yueh-Min Huang, National Cheng Kung University, Taiwan
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Yvan Baudouin, Royal Military Academy, Belgium