Description
The International Journal of Measurement Technologies and Instrumentation Engineering (IJMTIE) is a dedicated source for high quality papers on measurement and instrumentation and displays how every process must be represented by means of data and the outcome must be referred to the true value. Development of measurement techniques is key in many areas, including the internet, power quality, renewable energy, biotechnology, and nanotechnology. Conversely, to express and display data, instrumentation is needed to process this information. Advances in instrumentation depend on improvements of electronic devices, physics, and material engineering. IJMTIE encourages contributions from eminent and distinguished scholars and academicians, practitioners, and entrepreneurs working in these areas.
Topics Covered
- Analog and digital systems
- Bioelectronics
- Biomedical and environmental applications
- Custom and semi-custom circuitry
- Data Acquisition
- Devices and components
- Diagnosis and classification
- Distributed measurements
- Energy Harvesting
- Image and signal processing
- Instrumentation improvements
- Mathematical models and design
- MEMS
- Metrics
- Metrology
- Microcontrol
- Nano and molecular electronics
- Networking and interoperability
- New methods and techniques of measurement
- Power Quality
- Quality
- Reliability
- Remote Sensing
- Sampling
- Sensors and actuators
- Spectroscopy
- Standardization
- Statistics
- Test and measurements
- Wireless architectures
Mission and Scope
The mission of the
International Journal of Measurement Technologies and Instrumentation Engineering (IJMTIE) is to serve as a platform and community for researchers, technicians, graduate students, and practitioners to develop and propose high quality ideas on topics in measurement and instrumentation, as measurement technologies and instrumentation have a multidisciplinary impact in the field of applied sciences and elsewhere. The goal of the journal is to host theoretical and practical aspects and reports on experimental activities concerning measurement technologies and instrumentation and introduce new and emerging areas of these fields.
Table of Contents and List of Contributors
Volume 7: 2 Issues (2018)
Volume 7: 2 Issues (2018): Forthcoming, Available for Pre-Order
Volume 6: 2 Issues (2017)
Volume 6: 2 Issues (2017): Forthcoming, Available for Pre-Order
Volume 5: 2 Issues (2015)
Volume 5: 2 Issues (2015): Forthcoming, Available for Pre-Order
Volume 4: 2 Issues (2014)
Volume 4: 2 Issues (2014): Forthcoming, Available for Pre-Order
Volume 3: 4 Issues (2013)
Volume 3: 4 Issues (2013): Forthcoming, Available for Pre-Order
Volume 2: 4 Issues (2012)
Volume 2: 4 Issues (2012): Forthcoming, Available for Pre-Order
Volume 1: 4 Issues (2011)
Volume 1: 4 Issues (2011): Forthcoming, Available for Pre-Order
View Complete Journal Contents ListingIndices
Editor(s)-in-Chief Biography
Prof. Md. Zia Ur Rahman, Senior Member of IEEE, is with K L University, Guntur, India. He obtained an M.Tech in Electronics and Communication Engineering and a Ph. D in Biomedical Signal Processing from Andhra University, India. He is a reviewer for several international journals, includes IGI, IEEE, Elsevier, Springer, IET, Hindawai, Eurasip, JMIHI and many more. Prof. Zia also acted as a TPC member for more than 50 conferences. He is an active member of various professional bodies like IEEE, Instrument Society of India, Indian Society for Technical Education, International Frequency Sensor Association, International Association of Engineers, International Association of Computer Science and Information Technology, The Applied Computational Electromagnetics Society, etc. He has authored and co-authored more than 100 papers in International journals and proceedings.
Editorial Board
- Editor-in-Chief Emeritus
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Aimé Lay-Ekuakille, University of Salento, Italy
- International Advisory Board
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Arun Fera M, Thiagarajar College of Engineering, India
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C L V R S V Prasad, GMR Institute of Technology, Kakinada, India
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K VINOTH KUMAR, Karunya Institute of Technology and Sciences, India
https://orcid.org/0000-0002-3009-1658 -
P. Govinda Rao, GMR Institute of Technology, India
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Rupesh Kumar, Systems RF, XLIM Research Institute, France
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Soubantika Palchoudhury, University of Tennessee at Chattanooga, United States
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Srinivasan Ganesh Kumar, Anna University, India
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Surjit Singh, Thapar Institute of Engineering & Technology, Patiala, Punjab, India, India
https://orcid.org/0000-0002-2386-7729 -
Yunus Arslan, Istanbul Univesity, Turkey
- Associate Editors
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Andreas Lymberis, European Comission, Belgium
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Claudio De Capua, Mediterranean University of Reggio Calabria, Italy
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Domenico Grimaldi, University of Calabria, Italy
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Domenico Laforgia, University of Salento, Italy
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Dominic Onyango, Multimedia College University of Nairobi, Kenya
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Giuseppe Ricci, University of Salento, Italy
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Leo Van Biesen, Free University of Brussels, Belgium
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Linus Michaeli, Kosice Technical University, Slovakia
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Massimo Villari, University of Messina, Italy
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Mel Siegel, Carnegie Mellon University, United States
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Olfa Kanoun, Chemnitz Technical University, Germany
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Paolo Bonato, Harvard Medical School, United States
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Pasquale Daponte, University of Sannio, Italy
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Pedro Girao, Instituto Superior de Telecomunicaoes, Portugal
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Ramiro Velázquez, Universidad Panamericana, Mexico
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Roman Malaric, University of Zagreb, Croatia
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Sanowar Khan, City University of London, United Kingdom
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Silvestro Micera, Sant’Anna School of Pisa, Italy
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Subhas Mukhopadhyay, Massey University, New Zealand
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Sunao Yamashita, DKK-TOA Corporation, Japan
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Vito Telesca, University of Basilicata, Italy
- Editorial Review Board
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Adel Alimi, Université de Sfax, Tunisia
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Alfonso Centuori, CMC Srl, Italy
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Amerigo Trotta, Polytechnic of Bari, Italy
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Andrea Baschirotto, University of Milan-Bicocca, Italy
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Antonio Ficarella, University of Salento, Italy
https://orcid.org/0000-0003-3206-4212 -
Beata Palczynska, Gdynia Maritime University, Poland
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Bernd Neuner, Tigo Energy, Germany
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Claudine Gehin, Institut National des Sciences Appliquées, France
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Cristian Fosalau, Technical University of Iasi, Romania
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Domenico Chianese, University of Applied Sciences and Arts, Switzerland
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Emiliano Schena, Università Campus Bio-Medico di Roma, Italy
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F.M. Tshizanga, Université Pédagogique Nationale, Congo, The Democratic Republic Of The
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Faouzi Derbel, QVEDIS GmbH, Germany
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Francesco Amato, University of Catanzaro, Italy
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Gerhard Fischerauer, University of Bayreuth, Austria
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Gerson Rocha, Brazilian Metrology Society, Brazil
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Gourab Sen Gupta, Massey University, New Zealand
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Jean-Marie Moanda, Ndeko, Congo, The Democratic Republic Of The
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Klaus-Dieter Sommer, Physikalisch-Technische Bundesanstalt, Germany
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Luigi Notaro, Lecroy, Italy
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Marco Liserre, Polytechnic of Bari, Italy
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Mart Mirt, Tallin University of Technology, Estonia
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Massimo De Vittorio, University of Salento, Italy
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Mladen Borsic, Croatian Metrological Society, Croatia
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Nabil Derbel, National School of Engineers of Sfax, Tunisia
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Nitin Mandavgade, Priyadarshini College of Engineering, India
https://orcid.org/0000-0003-1052-7239 -
Octavian Postolache, Institutode Telecomunicaoes, Portugal
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Pawel Turcza, AGH University of Kracow, Poland
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Peter Palensky, University of Vienna, Austria
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Philippe Vanderbemden, University of Liège, Belgium
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Pietro Siciliano, Institute for Microelectronics and Microsystems, Italy
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Roland Collay, Measuring Club of Rhône Alps, France
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Rosario Morello, University of Reggio Calabria, Italy
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Sergey Yurish, Catalunya University of Barcelona, Spain
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Sergio Casciaro, Istituto di Fisiologia Clinica, Italy
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Sergio Rapuano, University of Sannio, Italy
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Sheila Bailey, NASA Glenn Research Center, United States
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Susana Borromeo, Universidad Rey Juan Carlos, Spain
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Theodore Laopoulos, Aristotle University of Thessaloniki, Greece
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Tina Liguori, University of Salerno, Italy
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Tom Zielinsky, AGH University of Kracow, Poland
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Umberto Pogliano, Istituto Nazionale di Ricerca Metrologica, Italy
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Voicu Croza, University of Ottawa, Canada
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Wolfgang Schufft, Chemnitz Technical University, Germany
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Yueh-Min Huang, National Cheng Kung University, Taiwan
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Yvan Baudouin, Royal Military Academy, Belgium