Description
The International Journal of Measurement Technologies and Instrumentation Engineering (IJMTIE) is a dedicated source for high quality papers on measurement and instrumentation and displays how every process must be represented by means of data and the outcome must be referred to the true value. Development of measurement techniques is key in many areas, including the internet, power quality, renewable energy, biotechnology, and nanotechnology. Conversely, to express and display data, instrumentation is needed to process this information. Advances in instrumentation depend on improvements of electronic devices, physics, and material engineering. IJMTIE encourages contributions from eminent and distinguished scholars and academicians, practitioners, and entrepreneurs working in these areas.
Topics Covered
- Analog and digital systems
- Bioelectronics
- Biomedical and environmental applications
- Custom and semi-custom circuitry
- Data acquisition
- Devices and components
- Diagnosis and classification
- Distributed measurements
- Energy harvesting
- Image and signal processing
- Instrumentation improvements
- Mathematical models and design
- MEMS
- Metrics
- Metrology
- Microcontrol
- Nano and molecular electronics
- Networking and interoperability
- New methods and techniques of measurement
- Power quality
- Quality
- Reliability
- Remote Sensing
- Sampling
- Sensors and actuators
- Spectroscopy
- Standardization
- Statistics
- Test and measurements
- Wireless architectures
Mission and Scope
The mission of the
International Journal of Measurement Technologies and Instrumentation Engineering (IJMTIE) is to serve as a platform and community for researchers, technicians, graduate students, and practitioners to develop and propose high quality ideas on topics in measurement and instrumentation, as measurement technologies and instrumentation have a multidisciplinary impact in the field of applied sciences and elsewhere. The goal of the journal is to host theoretical and practical aspects and reports on experimental activities concerning measurement technologies and instrumentation and introduce new and emerging areas of these fields.
Table of Contents and List of Contributors
Volume 7: 2 Issues (2018): 1 Released, 1 Forthcoming
Volume 7: 2 Issues (2018): Forthcoming, Available for Pre-Order
Volume 6: 2 Issues (2017)
Volume 6: 2 Issues (2017): Forthcoming, Available for Pre-Order
Volume 5: 2 Issues (2015)
Volume 5: 2 Issues (2015): Forthcoming, Available for Pre-Order
Volume 4: 2 Issues (2014)
Volume 4: 2 Issues (2014): Forthcoming, Available for Pre-Order
Volume 3: 4 Issues (2013)
Volume 3: 4 Issues (2013): Forthcoming, Available for Pre-Order
Volume 2: 4 Issues (2012)
Volume 2: 4 Issues (2012): Forthcoming, Available for Pre-Order
Volume 1: 4 Issues (2011)
Volume 1: 4 Issues (2011): Forthcoming, Available for Pre-Order
Indices
Editor(s)-in-Chief Biography
Prof. Md. Zia Ur Rahman, Senior Member of IEEE, is with K L University, Guntur, India. He obtained an M.Tech in Electronics and Communication Engineering and a Ph. D in Biomedical Signal Processing from Andhra University, India. He is a reviewer for several international journals, includes IGI, IEEE, Elsevier, Springer, IET, Hindawai, Eurasip, JMIHI and many more. Prof. Zia also acted as a TPC member for more than 50 conferences. He is an active member of various professional bodies like IEEE, Instrument Society of India, Indian Society for Technical Education, International Frequency Sensor Association, International Association of Engineers, International Association of Computer Science and Information Technology, The Applied Computational Electromagnetics Society, etc. He has authored and co-authored more than 100 papers in International journals and proceedings.
Editorial Board
- Editor-in-Chief Emeritus
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Aimé Lay-Ekuakille, University of Salento, Italy
- International Advisory Board
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Yunus Arslan, Istanbul Univesity, Turkey
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Srinivasan Ganesh Kumar, Anna University, India
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A Gopala Krishna, Jawaharlal Nehru Technological University, Kakinada, India
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P. Govinda Rao, GMR Institute of Technology, India
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K Vinoth K., Karunya University, India
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Rupesh Kumar, Systems RF, XLIM Research Institute, France
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Arun Fera M, Thiagarajar College of Engineering, India
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Soubantika Palchoudhury, University of Tennessee at Chattanooga, United States
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Surjit Singh, National Institute of Technology Kurukshetra, India
- Associate Editors
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Paolo Bonato, Harvard Medical School, United States
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Pasquale Daponte, University of Sannio, Italy
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Claudio De Capua, Mediterranean University of Reggio Calabria, Italy
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Pedro Girao, Instituto Superior de Telecomunicaoes, Portugal
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Domenico Grimaldi, University of Calabria, Italy
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Olfa Kanoun, Chemnitz Technical University, Germany
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Sanowar Khan, City University of London, United Kingdom
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Domenico Laforgia, University of Salento, Italy
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Andreas Lymberis, European Comission, Belgium
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Roman Malaric, University of Zagreb, Croatia
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Silvestro Micera, Sant’Anna School of Pisa, Italy
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Linus Michaeli, Kosice Technical University, Slovakia
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Subhas Mukhopadhyay, Massey University, New Zealand
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Dominic Onyango, Multimedia College University of Nairobi, Kenya
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Giuseppe Ricci, University of Salento, Italy
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Mel Siegel, Carnegie Mellon University, United States
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Vito Telesca, University of Basilicata, Italy
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Leo Van Biesen, Free University of Brussels, Belgium
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Ramiro Velázquez, Universidad Panamericana, Mexico
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Massimo Villari, University of Messina, Italy
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Sunao Yamashita, DKK-TOA Corporation, Japan
- Editorial Review Board
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Adel Alimi, Université de Sfax, Tunisia
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Francesco Amato, University of Catanzaro, Italy
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Sheila Bailey, NASA Glenn Research Center, United States
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Andrea Baschirotto, University of Milan-Bicocca, Italy
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Yvan Baudouin, Royal Military Academy, Belgium
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Susana Borromeo, Universidad Rey Juan Carlos, Spain
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Mladen Borsic, Croatian Metrological Society, Croatia
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Sergio Casciaro, Istituto di Fisiologia Clinica, Italy
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Alfonso Centuori, CMC Srl, Italy
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Domenico Chianese, University of Applied Sciences and Arts, Switzerland
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Roland Collay, Measuring Club of Rhône Alps, France
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Voicu Croza, University of Ottawa, Canada
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Massimo De Vittorio, University of Salento, Italy
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Faouzi Derbel, QVEDIS GmbH, Germany
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Nabil Derbel, National School of Engineers of Sfax, Tunisia
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Antonio Ficarella, University of Salento, Italy
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Gerhard Fischerauer, University of Bayreuth, Austria
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Cristian Fosalau, Technical University of Iasi, Romania
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Claudine Gehin, Institut National des Sciences Appliquées, France
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Yueh-Min Huang, National Cheng Kung University, Taiwan
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Theodore Laopoulos, Aristotle University of Thessaloniki, Greece
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Tina Liguori, University of Salerno, Italy
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Marco Liserre, Polytechnic of Bari, Italy
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Nitin Mandavgade, Priyadarshini College of Engineering, India
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Mart Mirt, Tallin University of Technology, Estonia
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Jean-Marie Moanda, Ndeko, Congo, The Democratic Republic Of The
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Rosario Morello, University of Reggio Calabria, Italy
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Bernd Neuner, Tigo Energy, Germany
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Luigi Notaro, Lecroy, Italy
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Beata Palczynska, Gdynia Maritime University, Poland
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Peter Palensky, University of Vienna, Austria
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Umberto Pogliano, Istituto Nazionale di Ricerca Metrologica, Italy
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Octavian Postolache, Institutode Telecomunicaoes, Portugal
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Sergio Rapuano, University of Sannio, Italy
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Gerson Rocha, Brazilian Metrology Society, Brazil
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Emiliano Schena, Università Campus Bio-Medico di Roma, Italy
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Wolfgang Schufft, Chemnitz Technical University, Germany
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Gourab Sen Gupta, Massey University, New Zealand
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Pietro Siciliano, Institute for Microelectronics and Microsystems, Italy
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Klaus-Dieter Sommer, Physikalisch-Technische Bundesanstalt, Germany
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Amerigo Trotta, Polytechnic of Bari, Italy
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F.M. Tshizanga, Université Pédagogique Nationale, Congo, The Democratic Republic Of The
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Pawel Turcza, AGH University of Kracow, Poland
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Philippe Vanderbemden, University of Liège, Belgium
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Sergey Yurish, Catalunya University of Barcelona, Spain
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Tom Zielinsky, AGH University of Kracow, Poland
Submission
Prospective authors should note that only original and previously unpublished articles will be considered. INTERESTED AUTHORS MUST CONSULT THE JOURNAL’S GUIDELINES FOR MANUSCRIPT SUBMISSIONS at http://www.igi-global.com/publish/contributor-resources/before-you-write/ PRIOR TO SUBMISSION. All article submissions will be forwarded to at least 3 members of the Editorial Review Board of the journal for double-blind, peer review. Final decision regarding acceptance/revision/rejection will be based on the reviews received from the reviewers.All submissions and inquiries should be directed to the attention of:
Ireneusz Jablonski & Md. Zia-Ur-Rahman
Editors-in-Chief
International Journal of Measurement Technologies and Instrumentation Engineering (IJMTIE)
Emails: i.jablonski@wp.pl; mdzr55@gmail.com