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Investigating Opto-Electronic Properties of Surface Plasmon Structure for Spectroscopic Applications

Investigating Opto-Electronic Properties of Surface Plasmon Structure for Spectroscopic Applications

Pratibha Verma, Arpan Deyasi
Copyright: © 2019 |Pages: 61
ISBN13: 9781522585312|ISBN10: 1522585311|ISBN13 Softcover: 9781522585329|EISBN13: 9781522585336
DOI: 10.4018/978-1-5225-8531-2.ch010
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MLA

Verma, Pratibha, and Arpan Deyasi. "Investigating Opto-Electronic Properties of Surface Plasmon Structure for Spectroscopic Applications." Contemporary Developments in High-Frequency Photonic Devices, edited by Siddhartha Bhattacharyya, et al., IGI Global, 2019, pp. 216-276. https://doi.org/10.4018/978-1-5225-8531-2.ch010

APA

Verma, P. & Deyasi, A. (2019). Investigating Opto-Electronic Properties of Surface Plasmon Structure for Spectroscopic Applications. In S. Bhattacharyya, P. Debnath, A. Deyasi, & N. Dey (Eds.), Contemporary Developments in High-Frequency Photonic Devices (pp. 216-276). IGI Global. https://doi.org/10.4018/978-1-5225-8531-2.ch010

Chicago

Verma, Pratibha, and Arpan Deyasi. "Investigating Opto-Electronic Properties of Surface Plasmon Structure for Spectroscopic Applications." In Contemporary Developments in High-Frequency Photonic Devices, edited by Siddhartha Bhattacharyya, et al., 216-276. Hershey, PA: IGI Global, 2019. https://doi.org/10.4018/978-1-5225-8531-2.ch010

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Abstract

This chapter is proposed with an approach to analyze reflectance as a function of negative index material thickness for different parameters under the surface plasmon condition and extended approach towards the field enhancement of electric field as function of incidence angle and transmittance as function of incidence angle has been analyzed. This chapter can reflect the good comparison between 3 layer medium and n layer medium model. Characteristic impedance of MIM surface plasmon structure is analytically calculated considering the effect of both Faraday inductance and kinetic inductance. Effect of metal layer thickness, insulator thickness, and electron density are tailored to observe the impedance variation with frequency. Wavelength dependence of characteristic impedance and quality factor of MIM (metal-insulator-metal) surface plasmon structure is analyzed. Structural parameters and damping ratio of the structure is tuned within allowable limit to analyze the variation after detailed analytical computation.

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