AC Magnetic Measurements on Superconductors: Design of a Device for Magneto-Thermal Measurements

AC Magnetic Measurements on Superconductors: Design of a Device for Magneto-Thermal Measurements

Philippe Laurent, Jean-François Fagnard, Philippe Vanderbemden
ISBN13: 9781466641655|ISBN10: 1466641657|EISBN13: 9781466641662
DOI: 10.4018/978-1-4666-4165-5.ch016
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MLA

Laurent, Philippe, et al. "AC Magnetic Measurements on Superconductors: Design of a Device for Magneto-Thermal Measurements." Advanced Instrument Engineering: Measurement, Calibration, and Design, edited by Aimé Lay-Ekuakille, IGI Global, 2013, pp. 208-222. https://doi.org/10.4018/978-1-4666-4165-5.ch016

APA

Laurent, P., Fagnard, J., & Vanderbemden, P. (2013). AC Magnetic Measurements on Superconductors: Design of a Device for Magneto-Thermal Measurements. In A. Lay-Ekuakille (Ed.), Advanced Instrument Engineering: Measurement, Calibration, and Design (pp. 208-222). IGI Global. https://doi.org/10.4018/978-1-4666-4165-5.ch016

Chicago

Laurent, Philippe, Jean-François Fagnard, and Philippe Vanderbemden. "AC Magnetic Measurements on Superconductors: Design of a Device for Magneto-Thermal Measurements." In Advanced Instrument Engineering: Measurement, Calibration, and Design, edited by Aimé Lay-Ekuakille, 208-222. Hershey, PA: IGI Global, 2013. https://doi.org/10.4018/978-1-4666-4165-5.ch016

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Abstract

This work describes the design and realisation of an apparatus to measure simultaneously the AC magnetic properties and the temperature distribution on the top surface of bulk superconducting samples (up to 32 mm in diameter) in cryogenic conditions (temperature range 78-120 K). First the authors describe the experimental set-up used for simultaneous thermal and magnetic characterization of the sample. Next, the authors describe the practical considerations required for generating the large AC magnetic fields, possibly in the presence of DC fields. Then the authors present the data acquisition system allowing both temperature and magnetic data to be recorded at high a sampling rate.” The performances and limitations of the system are discussed.

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