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X-Ray Line Profile Analysis for Single Crystals

X-Ray Line Profile Analysis for Single Crystals

Copyright: © 2014 |Pages: 29
ISBN13: 9781466658523|ISBN10: 1466658525|EISBN13: 9781466658530
DOI: 10.4018/978-1-4666-5852-3.ch008
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MLA

Jenő Gubicza. "X-Ray Line Profile Analysis for Single Crystals." X-Ray Line Profile Analysis in Materials Science, IGI Global, 2014, pp.242-270. https://doi.org/10.4018/978-1-4666-5852-3.ch008

APA

J. Gubicza (2014). X-Ray Line Profile Analysis for Single Crystals. IGI Global. https://doi.org/10.4018/978-1-4666-5852-3.ch008

Chicago

Jenő Gubicza. "X-Ray Line Profile Analysis for Single Crystals." In X-Ray Line Profile Analysis in Materials Science. Hershey, PA: IGI Global, 2014. https://doi.org/10.4018/978-1-4666-5852-3.ch008

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Abstract

The features of the dislocation structure in plastically deformed single crystals can be determined from diffraction line broadening. Both the measuring and the evaluation procedures of X-ray line profiles are somewhat different from the methods used for polycrystalline materials. In this chapter, these procedures are overviewed, and their effectiveness is illustrated by representative examples. It is shown that the intensity distribution in the vicinity of the reciprocal lattice points can be mapped by rocking the single crystal about appropriate axes. From the detected intensity distribution, the density, the slip systems, and the arrangement of dislocations, as well as the lattice misorientation can be determined. The average misorientation obtained from rocking curve measurement can be related to the density of geometrically necessary dislocations. It is also shown that the inhomogeneous distribution of dislocations in plastically deformed single crystals usually results in asymmetric line profiles. The evaluation of these peaks enables the determination of the long-range internal stresses besides the dislocation densities in the dislocation cell walls and interiors.

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