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Brain Electrical Oscillation Signature Profiling (BEOS)

Brain Electrical Oscillation Signature Profiling (BEOS)

Vishal Kumar Parmar, C. R. Mukundan
Copyright: © 2017 |Volume: 2 |Issue: 1 |Pages: 24
ISSN: 2470-8526|EISSN: 2470-8534|EISBN13: 9781522515999|DOI: 10.4018/IJCCP.2017010101
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MLA

Parmar, Vishal Kumar, and C. R. Mukundan. "Brain Electrical Oscillation Signature Profiling (BEOS)." IJCCP vol.2, no.1 2017: pp.1-24. http://doi.org/10.4018/IJCCP.2017010101

APA

Parmar, V. K. & Mukundan, C. R. (2017). Brain Electrical Oscillation Signature Profiling (BEOS). International Journal of Computers in Clinical Practice (IJCCP), 2(1), 1-24. http://doi.org/10.4018/IJCCP.2017010101

Chicago

Parmar, Vishal Kumar, and C. R. Mukundan. "Brain Electrical Oscillation Signature Profiling (BEOS)," International Journal of Computers in Clinical Practice (IJCCP) 2, no.1: 1-24. http://doi.org/10.4018/IJCCP.2017010101

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Abstract

This article shows the development of techniques for deception detection has reached a stage of extreme complexity as the information sought must be extracted from the brain of suspects, instead of making inferences about it from the emotional effects produced during the traditional lie detection tests. This includes the presentation of concealed information and oral or behavioral responses by the individual are necessary requirements for use of these techniques. The new technique described here extracts information directly from memory, without having the individual respond to the statements - probes presented. It measures the components of electrical oscillations generated during remembrance of autobiographical episodes, which can occur only when one has acquired the experiences through participation in the said activities.

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