The author sets out to provide a survey of the field of X-ray line profile analysis
(XLPA) for the materials sciences. The book covers basic and advanced XLPA,
and attempts to fill in the gaps in the current literature. From my perspective,
the author has done a reasonably good job. The book is divided into nine chapters.
Each provides an introduction and a conclusion, which covers the content of the chapter nicely. Each chapter also has its own list of references, and a compilation of references is provided at the end.
– Joseph D. Ferrara, Ph.D., Chief Science Officer, Rigaku (The Bridge, Issue 12)