Integrated Circuit Emission Model Extraction with a Fuzzy Logic System

Integrated Circuit Emission Model Extraction with a Fuzzy Logic System

Tsung-Chih Lin (Feng Chia University, Taiwan), Ming-Jen Kuo (Feng Chia University, Taiwan) and Alexandre Boyer (University of Toulouse, France)
DOI: 10.4018/978-1-4666-1870-1.ch014
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This paper describes a novel technique for multiple parameter extraction of the S12X TEM cell model using a fuzzy logic system (FLS). The FLS is utilized to capture the circuit information and to extract the circuit parameters based on experiential knowledge. The proposed extraction technique uses both linguistic information (i.e., human-like knowledge and experience) and numerical data of measurement to construct the fuzzy macromodel. The simulation results confirm the validity and estimation performance of the equivalent circuit by the advocated design methodology.
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Modeling Of The Circuit Under Test

This paper works on the model of a commercial component, which is named S12X 16-bit microcontroller and has been widely embedded in automotive electronic systems. Various conducted and radiated emission measurements were performed and a single ICEM model was proposed to predict the emission spectrum level (Labussiere et al., 2008). Radiated measurements were done in a gigahertz transverse electromagnetic (GTEM) cell designed to extend the frequency range of measurement (typically up to 18 GHz) higher than a TEM cell in the frequency domain due to its match termination and tapered structure (IC-EMC, 2002). The protocol for IC emission measurement in the GTEM cell is shown in Figure 1. For each program running in the microcontroller and the different orientations of the test board in the cell, we select the maximum radiated spectrum as the desired data. Frequency of interest is limited to be up to 2GHz.

Figure 1.

GTEM cell measurement setup (IC-EMC, 2002)

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