MLA
Larsson, Anders, et al. "Study on Combined Test-Data Compression and Test Planning for Testing of Modular SoCs." Design and Test Technology for Dependable Systems-on-Chip, edited by Raimund Ubar, et al., IGI Global, 2011, pp. 434-459. https://doi.org/10.4018/978-1-60960-212-3.ch020
APA
Larsson, A., Ingelsson, U., Larsson, E., & Chakrabarty, K. (2011). Study on Combined Test-Data Compression and Test Planning for Testing of Modular SoCs. In R. Ubar, J. Raik, & H. Vierhaus (Eds.), Design and Test Technology for Dependable Systems-on-Chip (pp. 434-459). IGI Global. https://doi.org/10.4018/978-1-60960-212-3.ch020
Chicago
Larsson, Anders, et al. "Study on Combined Test-Data Compression and Test Planning for Testing of Modular SoCs." In Design and Test Technology for Dependable Systems-on-Chip, edited by Raimund Ubar, Jaan Raik, and Heinrich Theodor Vierhaus, 434-459. Hershey, PA: IGI Global, 2011. https://doi.org/10.4018/978-1-60960-212-3.ch020
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