Let us assume that the chemical composition in a polycrystalline material varies from crystallite to crystallite. The various composition in the different crystallites yields different lattice parameters and therefore shifts of the centers of peak components scattered from different crystallites as illustrated schematically in Figure 1 (Leineweber & Mittemeijer, 2006). Therefore, an individual crystallite with a given composition contributes to a certain reflection hkl of the powder diffraction pattern with a profile having Dirac-delta shape and located at the scattering angle which corresponds to the chemical composition of the crystallite. In the case of reflection hkl the distribution of the interplanar spacing of lattice planes (hkl) in the different crystallites is the reason of peak broadening. The deviation of the interplanar spacing (dhkl) from the ideal value (d0,hkl) due to alloying or impurity elements can be regarded as a lattice strain (εhkl) using the following formula (Leineweber, 2009):