X-Ray Line Profile Analysis in Materials Science

X-Ray Line Profile Analysis in Materials Science

Jenő Gubicza (Eötvös Loránd University, Hungary)
Indexed In: INSPEC, SCOPUS
Release Date: March, 2014|Copyright: © 2014 |Pages: 359
DOI: 10.4018/978-1-4666-5852-3
ISBN13: 9781466658523|ISBN10: 1466658525|EISBN13: 9781466658530
Hardcover:
Available
$215.00
TOTAL SAVINGS: $215.00
Benefits
  • Printed-On-Demand (POD)
  • Usually ships one day from order
E-Book:
(Multi-User License)
Available
$193.50
List Price: $215.00
10% Discount:-$21.50
TOTAL SAVINGS: $21.50
Benefits
  • Multi-user license (no added fee)
  • Immediate access after purchase
  • No DRM
  • ePub with PDF download
Hardcover +
E-Book:
(Multi-User License)
Available
$260.00
TOTAL SAVINGS: $260.00
Benefits
  • Printed-On-Demand (POD)
  • Usually ships one day from order
  • Multi-user license (no added fee)
  • Immediate access after purchase
  • No DRM
  • ePub with PDF download
OnDemand:
(Individual Chapters)
Available
$37.50
TOTAL SAVINGS: $37.50
Benefits
  • Purchase individual chapters from this book
  • Immediate PDF download after purchase or access through your personal library
Description & Coverage
Description:

X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field.

X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.

Coverage:

The many academic areas covered in this publication include, but are not limited to:

  • Applications of X-Ray Line Profile Analysis
  • Crystallite Size Broadening of Diffraction Line Profiles
  • Evaluation Methods of Line Profiles
  • Influence of Chemical Heterogeneities
  • Kinematical X-Ray Scattering Theory
  • Line Profiles Caused by Planar Faults
  • Peak Profile Evaluation for Thin Films
  • Strain Broadening of X-Ray Diffractional Peaks
  • X-Ray Line Profile Analysis for Single Crystals
Reviews and Testimonials

The author sets out to provide a survey of the field of X-ray line profile analysis (XLPA) for the materials sciences. The book covers basic and advanced XLPA, and attempts to fill in the gaps in the current literature. From my perspective, the author has done a reasonably good job. The book is divided into nine chapters. Each provides an introduction and a conclusion, which covers the content of the chapter nicely. Each chapter also has its own list of references, and a compilation of references is provided at the end.

–  Joseph D. Ferrara, Ph.D., Chief Science Officer, Rigaku (The Bridge, Issue 12)
Table of Contents
Search this Book:
Reset
Editor/Author Biographies
Jeno Gubicza is a Professor at Eotvos Lorand University in Budapest, Hungary. He received his PhD and Dr.habil degrees in 1997 and 2005, respectively. Prof. Gubicza’s main research field is the study of the microstructure by X-ray line profile analysis. His first book entitled, Defect Structure in Nanomaterial, was published in 2012. Prof. Gubicza was awarded the scientific title of Doctor of the Hungarian Academy of Sciences, the Schmid Rezso Prize of Roland Eotvos Physical Society, and the Bolyai-plaquette of Hungarian Academy of Sciences. He has published more than 160 papers that have been cited more than 1600 times.
Peer Review Process
The peer review process is the driving force behind all IGI Global books and journals. All IGI Global reviewers maintain the highest ethical standards and each manuscript undergoes a rigorous double-blind peer review process, which is backed by our full membership to the Committee on Publication Ethics (COPE). The full publishing process and peer review are conducted within the IGI Global eEditorial Discovery® online submission system and on average takes 30 days. Learn More
Ethics & Malpractice
IGI Global affirms that ethical publication practices are critical to the successful development of knowledge. Therefore, it is the policy of IGI Global to maintain high ethical standards in all publications. These standards pertain to all books, journals, chapters, and articles accepted for publication. This is in accordance with standard scientific principles and IGI Global’s position as a source of scientific knowledge. Learn More
Abstracting & Indexing
Archiving
All of IGI Global's content is archived via the CLOCKSS and LOCKSS initiative. Additionally, all IGI Global published content is available in IGI Global's InfoSci® platform.