MLA
Novák, Ondrej. "Reduction of the Transferred Test Data Amount." Design and Test Technology for Dependable Systems-on-Chip, edited by Raimund Ubar, et al., IGI Global, 2011, pp. 460-475. http://doi:10.4018/978-1-60960-212-3.ch021
APA
Novák, O. (2011). Reduction of the Transferred Test Data Amount. In Ubar, R., Raik, J., & Vierhaus, H. T. (Eds.), Design and Test Technology for Dependable Systems-on-Chip (pp. 460-475). IGI Global. http://doi:10.4018/978-1-60960-212-3.ch021
Chicago
Novák, Ondrej. "Reduction of the Transferred Test Data Amount." In Design and Test Technology for Dependable Systems-on-Chip. edited by Raimund Ubar , Jaan Raik , and Heinrich Theodor Vierhaus, 460-475. Hershey, PA: IGI Global, 2011. http://doi:10.4018/978-1-60960-212-3.ch021
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